Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

All matter is made of very small units called atoms. Atoms are so small they cannot be seen using a regular microscope. Scientists have discovered a way to “see” atoms using a special instrument ...

AFM facilitates atomic resolution imaging of insulator and conductor surfaces. One of the techniques utilizing AFM is frequency-modulation AFM (FM-AFM), which has been used for the atomic-resolution ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Anyone who has ever taken the time to critically examine a walnut knows that a two-dimensional photograph fails in many respects to truly convey the unique features--the nicks, crannies, valleys, and ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...