DFT's main target is to achieve maximum controllability and observability which helps to improve the yield and reliability of design. IDT helps improve the CVY and also the reliability of the design.

LSI Logic’s new Iddalyzer automated design-for-test (DFT) methodology for ASICs complements existing chip-test methodologies, such as scan or built-in self-test. The methodology thus lets you increase ...

Peter Maxwell, Research and Development Specialist, Semiconductor Products Group, Agilent Technologies Inc., Santa Clara, Calif., Pete O'Neil, Senior Technology ...

The functionality of embedded systems is becoming more and more sophisticated, and their real-time operation makes the debugging and verification of such systems extremely difficult to do in a ...